SUSS MicroTec's NC-1 Non-Contact System Wins International Award

"SUSS MicroTec is honored to have one of its products selected as'Best in Test' for 2006," states Dr. Claus Dietrich, Managing Directorof the Test Systems division at SUSS MicroTec. "This shows that we arecapable of offering the latest and most innovative technology fordesign and test engineers working on the most advanced devices in theworld."

The NC-1 Non-Contact System uses a patented technique to acquiresignals from very small features without loading the circuit undertest or relying on optical emissions. The NC-1 supplies both voltageand timing information, and the integrated atomic force probe enablesdeep sub-micron scanning and positioning. To extract measurements fromthe device, the tip of the probe is stimulated with electrical pulsesafter being placed above the area of interest. The forces generatedbetween the tip and the device under test are then measured andanalyzed by the NC-1 software, and the signal voltage waveform isextracted. This data is presented to the user in an easy-to-readformat.

"Our editorial panel was pleased to select the NC-1 as one of ourBest in Test products for 2006," said Test & Measurement World ChiefEditor Rick Nelson. "Its novel approach to acquiring voltage andtiming information without physical or electrical contact should proveto be valuable in failure analysis and other applications," he added.

About SUSS MicroTec

SUSS MicroTec is a leading supplier of production, process andtest technology for the semiconductor industry. SUSS maintains itsleadership position with over 7,000 systems installed worldwide. SUSSproducts include coating developing systems, 1X full-field lithography(1XFFL) systems, substrate bonders, flip-chip bonders and probesystems. Headquartered in Munich, Germany, SUSS has 5 internationalmanufacturing sites and provides support from sales and servicecenters in North America, Europe, Asia and Japan.

For more information about SUSS MicroTec, please visitwww.suss.com.

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