Advantest Reveals New M6245 Test Handler - Quick Facts

(RTTNews) - Semiconductor test equipment supplier Advantest Corp. (ATE) has launched its new M6245 test handler, offering great productivity with minimal downtime by incorporating the company's latest advances for handling double data rate and Flash memory devices.

Hiroki Ikeda, FA (factory automation) division manager of Advantest, said: "By combining improved positioning accuracy, higher throughput and tighter temperature control in a single system, our latest handler enables the most efficient testing of advanced memory ICs."

The M6245 handler incorporates a visual-alignment system that improves test yields by achieving contact accuracy to within 0.3 mm ball pitch. This makes the system capable of handling memories with fine pitches. The highly precise alignment capability also allows faster set-up and calibration, contributing to higher system productivity.

Further, a new handling design for M6245 ensures maximum throughput while applying visual alignment to support fine-pitch devices. Also, the design enables maximum possible throughput when using mechanical alignment for current pitch devices, the company said in a statement.